Course Content
Laboratory experiments on technology, characterization, design and simulation of devices and integrated circuits, based on courses EE 633, 661, 662, 665, 668 and 674. Fabrication of MOS capacitors and junction diodes. Characterization of MOS capacitors by C-V and I-V. Characterization of photovoltaic cells. Process simulation. Circuit and timing simulation. Design of standard cell and gate array based circuits and their simulation. Computer-aided testing of integrated circuits.
Text / References
- 1 E.H. Nicollian and J.R. Brews, MOS physics and technology, John Wiley, 1982. W.R. Runyan, Semiconductor measurements and instrumentation, McGraw Hill, 1975. S.M. Sze, VLSI technology, 2nd Ed., McGraw Hill, 1988.